MMS Events

12:00 p.m. Welcome

12:10 p.m. Dehua Yang, Ebatco - Chemical mapping using microscopic spectroscopy

12:30 p.m. Vern Robertson, JEOL - High Spatial Resolution, Low kV Microanalysis with an

FEG SEM and FEG EPMA

12:50 p.m. Mark Kelsey, Bruker - μ-XRF: A technique so versatile it is even being done

on Mars

1:10 p.m. Break

1:20 p.m. Business meeting

1:25 p.m. John Yorston, Thermo Scientific - Chemically Guided Rapid Failure Analysis

1:45 p.m. Andrew Lawson, Leica Microsystems / NCI - General workflow requirements in the EM lab

2:05 p.m. Stefan Mastel / Tobias Gokus, DMS - Correlation nanoscopy for organic, inorganic and

hybrid material characterization

2:25 p.m. Break

2:35 p.m. Mark Weiss, ESI - FTIR Imaging via FPA in the Characterization of

Environmental Effects on Polymers

2:55 p.m. Barnaby Levin, Direct Electron - Novel direct detectors for state-of-the-art electron

microscopy

3:15 p.m. Raffle and Social Time